Electronic Design

Quick Methods for Reliable Component Testing

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...
Purdue University

Purdue engineers create model for testing transistor reliability

WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...
Science Daily

Chemical etching method helps transistors stand tall

Researchers have developed a way to etch very tall, narrow finFETs, a type of transistor that forms a tall semiconductor 'fin' for the current to travel over. Smaller and faster has been the trend for ...
Semiconductor Engineering

Asynchronously Parallel Optimization Method For Sizing Analog Transistors Using Deep Neural Network Learning

A new technical paper titled “APOSTLE: Asynchronously Parallel Optimization for Sizing Analog Transistors Using DNN Learning” was published by researchers at UT Austin and Analog Devices. “Analog ...
EDN

Collector-Base-Emitter Pin Identifier of Transistors

The circuit has been designed for transistors to determine whether the pin is emitter, base or collector as well as the type if NPN or PNP polarity, and can also be used in testing diodes. 4011 – a ...
Electronic Design

Quick Methods for Reliable Component Testing

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...