Thought LeadersRick HaaschSenior Research ScientistMaterials Research Lab, University of Illinois In our latest interview, AZoMaterials speaks with Rick Haasch, a senior research scientist at the ...
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Supports a wide range of spectral data, including XPS, FT-IR, and NMR. From automatic determination of peak count and peak ...
XPS relies on the photoelectric effect, where irradiating a material with X-rays causes the emission of core electrons. The kinetic energy of these emitted electrons is measured, which can be directly ...